The company offers a range of award-winning measuring systems that provide contact-free and non-destructive analysis of topography, step height, roughness, layer thickness, and other parameters. These systems combine different measuring methods, including atomic force microscopy, and have measuring ranges from meters to sub-nanometers. FormFactor FRT Metrology's MicroProf® is widely used in various industries, such as semiconductor, advanced packaging, automotive, and optics, providing essential test and measurement technologies for research and production.